INOE 2000
National Institute of Research and Development for Optoelectronics - INOE 2000
Optoelectronic Methods with Biomedical Applications Department

INOE 2000

INOE 2000 Contact

S.V. Parasca, M.A. Calin, D. Manea, S. Miclos, R. Savastru. Hyperspectral index-based metric for burn depth assessment, BIOMEDICAL OPTICS EXPRESS, Volume 9, Issue 11, Pages:5778-5791, 2018, doi: 10.1364/BOE.9.005778.

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